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LATENT REFERENCES / TAG1

EUV

This reference note belongs to Tag1 in Latent References, an archive curated by Keigo Yoshida. Its archive region is Open source resources. The note preserves its source text and links so that readers can trace the material behind the 3D map.

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Tag1
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Open source resources

Archived reference note

English translation of the archived note. JP shows the original text. Source links and literal code are retained; the translation does not update or independently verify the source claims.

EUV (extreme ultraviolet) is a technology (EUV lithography) using short-wavelength light of 13.5nm to draw fine semiconductor circuits of 7nm or less. Essential for high-performance semiconductors such as smartphone and AI chips, its exposure machines are almost monopolized by the Netherlands’ ASML and are cutting-edge devices costing tens of billions of yen per 1 machine.

Source updated 2026-04-02 · Snapshot 2026-10-08